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IEC 60747-8:2010

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Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

Overview IEC 60747-8:2010 (consolidated with AMD1:2021) is the International Electrotechnical Commission standard that specifies definitions, ratings, characteristics and test methods for discrete fi…

IEC 60747-8-4:2004

Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for p…

BS IEC 60747-8-4:2004

Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switc…