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IEC 60749-8:2002/COR2:2003

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Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

IEC 60749-8:2002/COR1:2003

Active

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Overview IEC 60749-8:2002 is an international standard published by the International Electrotechnical Commission (IEC) that specifies mechanical and climatic test methods focused on the sealing and…