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IEC 60749-10:2002/COR1:2003

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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

IEC 60749-10:2022

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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subasse…

Overview IEC 60749-10:2022 is an internationally recognized standard that outlines mechanical shock test methods for semiconductor devices and subassemblies. Issued by the International Electrotechni…

IEC 60749-10:2002

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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock