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SIST EN ISO 8289-1:2020 PDF

Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects - Part 1: Swab test for non-profiled surfaces (ISO 8289-1:2020)

Title (English):
SIST EN ISO 8289-1:2020

Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects - Part 1: Swab test for non-profiled surfaces (ISO 8289-1:2020)

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
12
Publication date:
April 7, 2020
ICS:
25.220.50
Technical committee:
IPKZ - Protection of metals against corrosion
Description (English):

This document specifies two low voltage tests for detecting and locating defects that extend to the basis metal in vitreous and porcelain enamel coatings. Method A (electrical) is applicable to the rapid detection and determination of the general location of defects. Method B (optical), based on colour effects, is applicable to the more precise detection of defects and their exact locations. Both methods are commonly applied to flat surfaces. For more intricate shapes, such as undulated and/or corrugated surfaces, ISO 8289-2 is applicable. NOTE 1 Selection of the correct test method is critical to distinguish the areas of increased conductivity detected by method B from actual pores that extend to the basis metal, which can be detected by both methods. NOTE 2 The low voltage test is a non-destructive method of detecting defects and, therefore, is completely different from the high voltage test specified in ISO 2746. The results of the high and low voltage tests are not comparable and will differ.

Technical details

SKU
SIST EN ISO 8289-1:2020

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