BS IEC 62047-29:2017 PDF

Semiconductor devices. Micro-electromechanical devices - Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

Open preview (PDF)Semiconductor devices. Micro-electromechanical devices - Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

Title (English):

BS IEC 62047-29:2017

Semiconductor devices. Micro-electromechanical devices - Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

Document status:

Active

Format:

Electronic (PDF)

Publication date:

March 31, 2018

ICS:

31.080.01

Technical committee:

CENELEC

SKU:

BS IEC 62047-29:2017