BS IEC 62951-1:2017 PDF

Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates

Open preview (PDF)Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates

Title (English):

BS IEC 62951-1:2017

Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates

Document status:

Active

Format:

Electronic (PDF)

Publication date:

May 31, 2018

ICS:

31.080.99

SKU:

BS IEC 62951-1:2017