Overview
IEC 60749-17:2003 is an international standard issued by the International Electrotechnical Commission (IEC) that defines mechanical and climatic test methods for semiconductor devices, focusing specifically on neutron irradiation. This standard applies to integrated circuits and discrete semiconductor devices, providing guidelines to assess their susceptibility to degradation when exposed to neutron radiation. Primarily intended for military and space applications, the test described is destructive and critical for ensuring device reliability in harsh neutron environments.
Key Topics
Applications
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Military Electronics: Ensuring that semiconductor components maintain functionality under neutron bombardment encountered in defense systems.
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Space Industry: Validating integrated circuits and discrete semiconductor devices for exposure to high neutron fluxes in space environments, safeguarding satellite and spacecraft electronics.
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Reliability Testing: Providing a protocol for manufacturers of semiconductors to evaluate neutron tolerance, optimize design, and improve product longevity in radiation-prone environments.
Related Standards
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IEC 60034 Series: Covers electrical machinery but provides numbering context for IEC documents such as IEC 60749 series.
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ISO/IEC Directives, Part 2: Governs the drafting and maintenance of IEC standards ensuring international consensus.
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Military and Aerospace Quality Standards: While IEC 60749-17 addresses neutron irradiation testing, related military and aerospace standards may complement it to cover broader environmental stress testing.
Keywords: IEC 60749-17, neutron irradiation test, semiconductor device testing, neutron fluence, radiation susceptibility, integrated circuits, discrete semiconductors, military electronics, space applications, neutron radiation standards, dosimetry, pulsed reactor testing
Open preview (PDF)Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
