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IEC 61967-1:2018 PDF

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions

First page of standard IEC 61967-1:2018Open preview (PDF)Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Title (English):
IEC 61967-1:2018

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
79
Publication date:
December 12, 2018
Edition:
IEC IS 61967 edition 2 version 1
ICS:
31.200
Description (English):

IEC 61967-1:2018 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. Test method comparison tables are include in Annex A to assist in selecting the appropriate measurement method(s). The object of this document is to describe general conditions in order to establish a uniform testing environment and to obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this document are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit. The applicable frequency range is described in each part of IEC 61967. This edition includes the following significant technical changes with respect to the previous edition: - the frequency range of 150 kHz to 1 GHz has been deleted from the title; - the frequency step above 1 GHz has been added to Table 1, Table 2 and to 5.4; - Table A.1 has been divided into two tables, and IEC 61967-8 has been added to Table A.2 of Annex A; - the general test board description has been moved to Annex D.

Technical details

Technical committee
SC 47A - Integrated circuits
SKU
IEC 61967-1:2018

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