Overview
IEC 61967-8:2011 is an international standard published by the International Electrotechnical Commission (IEC) that specifies a measurement method for assessing electromagnetic radiated emissions from integrated circuits (ICs). This standard focuses on the IC stripline method, a technique that uses a transverse electromagnetic (TEM) waveguide setup to precisely measure emissions in the frequency range of 150 kHz to 3 GHz. The IC under test is mounted on an electromagnetic compatibility (EMC) test board positioned between the active conductor and the ground plane of an IC stripline structure.
This standard is part 8 in the IEC 61967 series dedicated to measuring electromagnetic emissions from integrated circuits and works in conjunction with IEC 61967-1:2002, which covers general conditions and definitions.
Key Topics
- IC Stripline Method: Utilizes a TEM stripline waveguide with an active conductor and a ground plane, guiding electromagnetic waves to enable accurate radiated emission measurements.
- Test Setup: Includes the IC mounted on a PCB between the stripline’s conductors, with optional shielded enclosures for controlling the electromagnetic environment.
- Frequency Range: Designed for radiated emission testing from 150 kHz up to 3 GHz, covering a broad spectrum relevant to integrated circuits.
- Test Equipment: Requires RF measuring instruments, preamplifiers, and 50 Ω termination elements tuned to the stripline’s characteristic impedance.
- Operational and Environmental Conditions: Defines strict test conditions such as supply voltage, ambient factors, and verification procedures of the stripline's RF characteristics.
- Measurement Procedure: Details step-by-step protocols for setting up, conducting, and reporting IC radiated emission tests.
- Reference Emission Levels: Provides normative and informative annexes specifying IC emission level expectations and test configurations.
Applications
IEC 61967-8:2011 is vital for organizations and professionals involved in:
- Integrated Circuit Development: Ensuring IC designs meet electromagnetic emission limits to reduce interference in electronic systems.
- EMC Testing Laboratories: Providing a standardized, repeatable method for evaluating IC radiated emissions as part of compliance verification.
- Quality Assurance in Semiconductor Manufacturing: Monitoring EMC parameters early in the production phase to prevent costly redesigns.
- Regulatory Compliance: Helping manufacturers meet international EMC requirements important for market access across regions.
- Research and Development: Supporting the study of IC electromagnetic behavior through precise measurement methodologies.
Related Standards
For comprehensive measurement of electromagnetic emissions, IEC 61967-8:2011 should be used alongside several related standards:
- IEC 61967-1:2002 - General conditions and definitions for IC electromagnetic emission measurement.
- IEC 61967-2 - Measurement of radiated emissions using TEM cell and wideband TEM cell methods.
- IEC 61000-4-20 - EMC testing and measurement techniques in TEM waveguides.
- IEC 60050-131 and IEC 60050-161 - Parts of the International Electrotechnical Vocabulary (IEV) defining EMC and circuit theory terms.
These standards provide foundational definitions, alternative measurement methods, and broader EMC testing guidelines, enabling a holistic approach to electromagnetic emission measurement for integrated circuits.
Keywords: IEC 61967-8, electromagnetic emissions, integrated circuits, IC stripline method, radiated emissions measurement, TEM waveguide, EMC testing, semiconductor standards, radiated emission frequency range, measurement procedures, EMI compliance.
Open preview (PDF)Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
