Overview
IEC TR 61967-4-1:2005 is a technical report published by the International Electrotechnical Commission (IEC) that provides application guidance for measuring electromagnetic emissions from integrated circuits (ICs) using the 1 Ω/150 Ω direct coupling method. This document is closely related to IEC 61967-4 and delivers detailed advice for conducting emission measurements on ICs within the 150 kHz to 1 GHz frequency range. It supports consistent comparison of emission results by specifying critical definitions and recommendations for test set-ups, IC operating modes, ports and pins, load circuits, and emission limits.
This technical report also introduces a functional classification of ICs into function modules, enhancing clarity in tests and supporting Parts 3, 5, and 6 of IEC 61967. The guidance herein is invaluable in ensuring reproducible and comparable results for electromagnetic compatibility (EMC) testing in the IC development process.
Key Topics
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IC Function Module Classification: The standard describes how to split various IC types into "IC function modules" (such as drivers, receivers, supply modules, and cores), streamlining the approach to EMC emission tests.
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Test Set-Up Guidance: It offers detailed instructions on how to set up test circuits, select relevant pins and ports, and configure operating modes for maximum measurement consistency.
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Port and Supply Testing: Recommendations are provided for selecting which IC ports and supply pins should be tested, prioritizing those most prone to emit electromagnetic disturbances.
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Workflow for EMC Testing: A step-by-step workflow is outlined for preparing, executing, and documenting IC emission tests, promoting best practices across different testing environments.
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Definitions Beyond IEC 61967-1 and -4: This report supplements previous standards by introducing additional definitions relevant to IC EMC measurements, covering aspects like operating modes, test board layout, and emission limits or classes.
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Application to Multiple IEC 61967 Parts: The methodology and classifications described can also be applied to the testing procedures described in IEC 61967 Parts 3, 5, and 6.
Applications
The practical applications of IEC TR 61967-4-1:2005 span the following areas:
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IC Design and Pre-Compliance: IC design teams use this guidance to assess EMC behavior early in the development process, aiding in the optimization of IC layouts to minimize conducted emissions.
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Standardized EMC Measurements: Laboratories and compliance agencies rely on the defined measurement approaches to ensure their results are comparable and repeatable across IC types and test environments.
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Testing of Diverse IC Types: The document's classification of IC modules supports the evaluation of microcontrollers, logic gate ICs, operational amplifiers, analog-to-digital converters, automotive transceivers, power switches, and more.
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Test Report Documentation: Detailed advice on structuring test reports ensures thorough documentation of methods, configurations, software setups (especially for CPU-containing cores), environmental parameters, and outcomes.
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Cross-Standard Consistency: The consistent methodology fosters coordinated EMC assessments across organizations and facilitates global regulatory acceptance.
Related Standards
- IEC 61967-1: General conditions and definitions for IC electromagnetic emission measurements.
- IEC 61967-4: Main standard for the 1 Ω/150 Ω direct coupling method for conducted emission testing.
- IEC 61967-3, -5, and -6: Cover radiated and conducted emissions using alternative test methods, which can benefit from the classification and workflow guidance found in TR 61967-4-1.
- IEC 60050(161): International Electrotechnical Vocabulary on electromagnetic compatibility.
- ISO 9141: Addresses interchange of digital information in automotive applications, relevant for certain IC driver and receiver modules.
IEC TR 61967-4-1:2005 is essential for professionals involved in IC development, EMC compliance, and quality assurance, offering structured, reliable practices for evaluating conducted emissions in modern electronic circuits. By adopting this guidance, organizations can achieve higher consistency, regulatory confidence, and product reliability in electromagnetic compatibility testing.
Open preview (PDF)Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
