Overview - ISO 14975:2000 (Surface chemical analysis - Information formats)
ISO 14975:2000 defines a structured text format to supplement ISO 14976 for transferring metadata needed to create, expand and revise a surface chemical analysis spectral database. The standard is explicitly applied to Auger electron spectroscopy (AES) and X‑ray photoelectron spectroscopy (XPS) spectral data. It prescribes machine‑readable “information packages” that can be embedded in the data transfer format (DTF) comment lines or attached alongside DTF files so existing DTF readers remain compatible.
Key topics and technical requirements
- Supplementary Packages: Three modular packages are specified - Specimen Information, Calibration Information, and Data Processing Information. Each package must appear as contiguous text lines and follow the defined order.
- Specimen metadata fields: The specimen package includes items such as host material, IUPAC chemical name, CAS registry number, composition, bulk purity, known impurities, structure, specimen mounting, ex‑situ and in‑situ preparation, charge control and specimen temperature, and more. All listed items shall be present in the order given.
- Calibration and processing fields: Calibration information covers energy, intensity and resolution calibration entries. Data processing information includes data‑handling procedures.
- Text formatting rules: Lines are limited to 80 characters, use the 7‑bit ASCII character set (plus SPACE), and use CR+LF as the end‑of‑line marker. Decimal points are represented with a point in computer entries.
- Compatibility and implementation: The textual form follows aspects of Microsoft Windows “.INI” file structure to ease implementation across programming environments. Packages are placed in DTF comment lines so legacy readers treat them as comments if unaware of the format.
- Informative annexes: Examples of formatted entries and example data are provided in annexes to aid implementers.
Applications and users
- Spectral database managers: Ensures consistent, searchable metadata for AES/XPS spectral libraries used in research and industry.
- Surface analytical laboratories: Standardizes specimen, calibration and processing metadata for traceability, reproducibility and audit trails.
- Instrument and software vendors: Enables interoperable export/import of spectral data and metadata between instruments, analysis software and databases.
- Standards bodies and quality systems: Supports conformity assessment, data exchange and long‑term archival of surface chemical analysis records.
Related standards
- ISO 14976 - Surface chemical analysis: Data transfer format (DTF): ISO 14975 is explicitly supplementary to and compatible with ISO 14976 and relies on it as the normative reference.
- Developed by ISO/TC 201 (Surface chemical analysis); annexes provide practical examples for implementation.
Keywords: ISO 14975:2000, surface chemical analysis, information formats, AES, XPS, spectral database, ISO 14976, data transfer format, specimen metadata, calibration metadata.
