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ISO 17915:2018 PDF

Optics and photonics — Measurement method of semiconductor lasers for sensing

First page of standard ISO 17915:2018Open preview (PDF)Optics and photonics — Measurement method of semiconductor lasers for sensing
Title (English):
ISO 17915:2018

Optics and photonics — Measurement method of semiconductor lasers for sensing

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
29
Publication date:
May 25, 2018
Edition:
ISO IS 17915 edition 1 version 1
ICS:
31.260
Description (English):

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications. This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

Technical details

Technical committee
ISO/TC 172/SC 9 - Laser and electro-optical systems
SKU
ISO 17915:2018

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