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ISO 18117:2009 PDF

Surface chemical analysis — Handling of specimens prior to analysis

First page of standard ISO 18117:2009Open preview (PDF)Surface chemical analysis — Handling of specimens prior to analysis
Title (English):
ISO 18117:2009

Surface chemical analysis — Handling of specimens prior to analysis

Document status:
Withdrawn
Format:
Electronic (PDF)
Number of pages:
9
Publication date:
March 3, 2009
Edition:
ISO IS 18117 edition 1 version 1
ICS:
71.040.40
Description (English):

ISO 18117:2009 gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly the following: Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.

Technical details

Technical committee
ISO/TC 201/SC 2 - General procedures
SKU
ISO 18117:2009

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