ISO 18452:2005 PDF

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer

Open preview (PDF)

Title (English):

ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer

Document status:: Active
Format:: Electronic (PDF)
Number of pages:: 9
Publication date:: November 16, 2005
Edition:: ISO IS 18452 edition 1 version 1
ICS:: 81.060.30

Delivery type:

Full version25 €Read online 24h10 €Read online 72h15 €

Document language:

enru

Delivery time:Immediate download

Price:25 €

Description (English):

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

Technical details

Technical committee: ISO/TC 206 - Fine ceramics
SKU: ISO 18452:2005

Abstract

Overview

ISO 18452:2005 specifies a standardized method to determine the thickness of fine ceramic films and ceramic coatings using a contact‑probe profilometer (stylus profilometer). The method is intended for thin films in the nominal range 10 nm to 10 000 nm, requiring a clearly defined boundary between coated and uncoated substrate areas. The standard defines measurement principle, apparatus requirements, specimen preparation, test procedure, calculation method and reporting.

Key Topics and Requirements

Measurement principle: Step‑height measurement by scanning a stylus across the coating edge and calculating the vertical difference at the inflection point of the profile.
Measurement range: Suitable for 10–10 000 nm film thicknesses; under optimal conditions profilometers may resolve steps of only a few nanometres, though accuracy degrades at very small thicknesses.
Apparatus:
- Contact‑probe profilometer conforming to ISO 3274.
- Diamond stylus with conical tip (vertical angles 60° or 90°) and tip radii typically 2 µm, 5 µm, 10 µm or 12.5 µm.
- Instrument calibration using step‑height calibration standards; calibration conditions should match measurement conditions.
Test specimen & surface:
- Distinct coated/uncoated boundary required.
- Surface roughness (Ra) of substrate and coating should be ≤ 1/5 of the step height.
- Average roughness wavelength should be

Related standards

Mentioned in the description and other ISO standards

Overview

Key Topics and Requirements

Measurement principle: Step‑height measurement by scanning a stylus across the coating edge and calculating the vertical difference at the inflection point of the profile.
Measurement range: Suitable for 10–10 000 nm film thicknesses; under optimal conditions profilometers may resolve steps of only a few nanometres, though accuracy degrades at very small thicknesses.
Apparatus:
- Contact‑probe profilometer conforming to ISO 3274.
- Diamond stylus with conical tip (vertical angles 60° or 90°) and tip radii typically 2 µm, 5 µm, 10 µm or 12.5 µm.
- Instrument calibration using step‑height calibration standards; calibration conditions should match measurement conditions.
Test specimen & surface:
- Distinct coated/uncoated boundary required.
- Surface roughness (Ra) of substrate and coating should be ≤ 1/5 of the step height.
- Average roughness wavelength should be

ISO 18452:2005 PDF

Technical details

Abstract

Overview

Key Topics and Requirements

Related standards

Abstract

Overview

Key Topics and Requirements

Related standards

Geometric product specifications (GPS). Surface texture. Profile method. Nominal characteristics of contact (…

Systems and software engineering — Software life cycle processes

Asset management — Vocabulary, overview and principles

Asset management — Asset management system — Requirements

Information technology — Radio frequency identification device conformance test methods — Part 2: Test method…

Information technology — Multimedia framework (MPEG-21) — Part 22: User Description

Milk — Determination of the lactoperoxidase activity — Photometric method (Reference method)

Carbonaceous materials for the production of aluminium — Cold and tepid ramming pastes — Expansion/shrinkage…