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ISO 23833:2013 PDF

Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

First page of standard ISO 23833:2013Open preview (PDF)Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
Title (English):
ISO 23833:2013

Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
27
Publication date:
April 5, 2013
Edition:
ISO IS 23833 edition 2 version 1
ICS:
01.040.71
Description (English):

ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order. ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

Technical details

Technical committee
ISO/TC 202/SC 1 - Terminology
SKU
ISO 23833:2013

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