ISO 24173:2009 PDF
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
Open preview (PDF)Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffractionTitle (English):
ISO 24173:2009
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
- Document status:
- Withdrawn
- Format:
- Electronic (PDF)
- Number of pages:
- 43
- Publication date:
- September 14, 2009
- Edition:
- ISO IS 24173 edition 1 version 1
- ICS:
- 71.040.50
Description (English):
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
Technical details
- Technical committee
- ISO/TC 202 - Microbeam analysis
- SKU
- ISO 24173:2009
