ISO 6342:1993 PDF
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Title (English):
ISO 6342:1993
Micrographics — Aperture cards — Method of measuring thickness of buildup area
- Document status:
- Withdrawn
- Format:
- Electronic (PDF)
- Number of pages:
- 3
- Publication date:
- August 5, 1993
- Edition:
- ISO IS 6342 edition 1 version 1
- ICS:
- 37.080
Description (English):
The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.
Technical details
- Technical committee
- ISO/TC 171/SC 2 - Document file formats, EDMS systems and authenticity of information
- SKU
- ISO 6342:1993
