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ISO 9220:1988 PDF

Metallic coatings — Measurement of coating thickness — Scanning electron microscope method

First page of standard ISO 9220:1988Open preview (PDF)Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Title (English):
ISO 9220:1988

Metallic coatings — Measurement of coating thickness — Scanning electron microscope method

Document status:
Withdrawn
Format:
Electronic (PDF)
Number of pages:
5
Publication date:
September 29, 1988
Edition:
ISO IS 9220 edition 1 version 1
ICS:
25.220.40
Description (English):

Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

Technical details

Technical committee
ISO/TC 107 - Metallic and other inorganic coatings
SKU
ISO 9220:1988

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