ISO 9220:1988 PDF
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Open preview (PDF)Metallic coatings — Measurement of coating thickness — Scanning electron microscope methodMetallic coatings — Measurement of coating thickness — Scanning electron microscope method
- Document status:
- Withdrawn
- Format:
- Electronic (PDF)
- Number of pages:
- 5
- Publication date:
- September 29, 1988
- Edition:
- ISO IS 9220 edition 1 version 1
- ICS:
- 25.220.40
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.
Technical details
- Technical committee
- ISO/TC 107 - Metallic and other inorganic coatings
- SKU
- ISO 9220:1988


