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IEC 60749-20:2020 PDF

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

First page of standard IEC 60749-20:2020Open preview (PDF)Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Title (English):
IEC 60749-20:2020

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
82
Publication date:
August 31, 2020
Edition:
IEC IS 60749 edition 3 version 1
ICS:
31.080.01
Description (English):

IEC 60749-20:2020 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. This edition includes the following significant technical changes with respect to the previous edition: - incorporation of a technical corrigendum to IEC 60749-20:2008 (second edition ); - inclusion of new Clause 3; - inclusion of explanatory notes.

Technical details

Technical committee
TC 47 - Semiconductor devices
SKU
IEC 60749-20:2020

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